AXIS Supra

AXIS Supra combines state-of-the-art XPS performance with unrivalled automation and ease of use. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode.

XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos flagship x-ray photoelectron spectrometer.

The AXIS Supra is based on the proven AXIS technology comprising: magnetic and electrostatic transfer lenses; co-axial electron only charge neutralisation; spherical mirror and hemispherical electron energy analysers. Kratos developed innovations such as the delay-line detector for spectroscopy and imaging modes and high energy, motorised, X-ray excitation sources ensure the AXIS Supra is capable of performing in the most demanding research and development environments. With market leading performance in both imaging and spectroscopy modes the AXIS Supra combines the highest level of automated sample handing with flexibility to incorporate complimentary analytical techniques in the analysis chamber.

The AXIS Supra is designed for ease of use with automated sample loading, optical microscopes for sample identification and positioning and intuitive data acquisition and processing software. However, users do not need to compromise performance for ease of use and automation. High sensitivity, excellent energy resolution and fast, high resolution imaging meet the analysis needs of the most demanding applications.


Watch a video introducing the AXIS Supra

(JHB) +27 (0) 11 475 1823

(DBN) +27 (0) 31 301 7617

(CPT) +27 (0) 21 461 9607