The NIMSA(National Institue of Metrology South Africa) based at the CSIR in Pretoria purchased an ION TOF time of flight mass spectrometer. It has now become a regularly used system. The TOF SIMS 5 has a range of capabilities with a bismuth primary ion gun for imaging with spatial resolution of < 100nm, spectroscopy capabilities up to many thousand Daltons and this can be accomplished on a wide range of samples such as metallic, insulating, polymers and biological with either smooth or rough surfaces.

It also has a depth profiling facility for ultra shallow measurements and high power capabilities for fast sputtering rates when greater depth is required.

Contact Richard Holton (sales@vacutec.co.za ) at Vacutec for further information.